SKU:21579539265

Thermal Oxide Wafer:300nm SiO2 Layer on Si (100)100mm diax0.5 mm t,P type, 1SP R:0.001-0.005 ohm.cm

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Regular price $148.75 USD
Regular price $178.75 USD Sale price $148.75 USD
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Ships within 48 hours · Estimated delivery Jul 13 - Jul 18

Description

Thermal Oxide Wafer:300nm SiO2 Layer on Si (100)100mm diax0.5 mm t,P type, 1SP R:0.001-0.005 ohm.cmThermal oxide Layer Research Grade , about 80 % useful area SiO2 layer on 100mm Silicon wafer Oxide layer thickness: 300 nm ( 3000A) + 10% Refractive index 1. 455 Silicon Wafer Specifications: Conductive type: P type B doped Resistivity: R: 0. 001 0. 005ohm. cm (If you would like to measure the resistivity accurately, please order our Portable 4 Probe Resistivity Testing Instrument.) Size: 100mm+ 0. 5 mm x 0. 5 mm Orientation: (100) + 0. 5o Polish:

Material Size Input: < 70mm in diameter

Two years limited with lifetime support

4) mm  dia x  175(+/-25) microns

8  wt% ( SiO2 )

Safety valve's open pressure: 1

< 5 o   +/- 1o

Brand new laptop with MS Window 10

100 cycles @ 1C: 99%

MTI's engineer will introduce some necessaryconnecting parts into this product

Please click to watch a video explanation of the split test cell installation

591l2 / (l2

Height     =   3

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