SKU:12350591782

Thermal Oxide Wafer: 1000 nm SiO2 Layer on Si (100), 4"dia x 0.525 mm t, Ptype , 1SP,R:1-20 ohm.cm

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Regular price $148.75 USD
Regular price $178.75 USD Sale price $148.75 USD
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Ships within 48 hours · Estimated delivery Jul 13 - Jul 18

Description

Thermal Oxide Wafer: 1000 nm SiO2 Layer on Si (100), 4"dia x 0.525 mm t, Ptype , 1SP,R:1-20 ohm.cmThermal oxide Layer Research Grade , about 80 % useful area SiO2 layer on 4'' Silicon wafer Oxide layer thickness: 1000 nm ( 10000A) + 10% Refractive index 1. 455 Silicon Wafer Specifications: Conductive type: P type B doped Resistivity: 1 10 ohm. cm (If you would like to measure the resistivity accurately, please order our Portable 4 Probe Resistivity Testing Instrument.) Size: 4" x 0. 5mm Orientation: (100) + 1o Polish: one side polished Surface

MTI provides 0

Orientation:    (110) +/-3 o

Must place 4 jars or 2 in symmetrical with similar weight in the ball mill to keep balance during rotation

Venting Port

Type:                                         SP1-8512T/BK-LL-P66

Ce:Lu2SiO5

EPD:                              <5000/cm^2

Size:             10x10x0

Maximum Pressure 120 PSI Decibel Rating (Outdoor) 60 dBA

Package:                       under 1000 class clean room  in wafer container

5 mm at 45o ±  5o

Orientation: (0001) +/-0

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